您好,欢迎来到镨烽(苏州)仪器-普西工业官方网站!可提供OEM代工服务,欢迎各地代理经销商垂询
热线电话:010-56212963
010-56203624
    产品与方案 PRODUCT DISPLAY
    半导体材料/器件测试解决方案
    半导体材料/器件测试解决方案
    微型真空光学及探针测试冷热台
    光学及探针测试冷热台(可客制)
    企业新闻 CORPORATE NEWS
    如您有任何需要我们提供的信息 请留言给我们

     

    首页产品与方案》详情
    校正片Calibration Substrates 

     

    Calibration Substrate allows the user to calibrate any microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected. Our line of calibration substrates is such a standard. Each calibration substrate contains highly precise elements for calibrating out the unavoidable errors and losses in a microwave network analyzer, its associated cabling, and the microwave probe to ensure accurate on-wafer testing.
    Features

    ● Supports Precise SOLT, LRL, and LRM calibrations

    ● Wide pitch range from 30 to 2,540 microns

    ● Suitable for all Picoprobes® from DC to 325 GHz

    ● Available for GS, SG, GSG Footprints

    ● Convenient alignment structures

    ● Individually tested and trimmed to exacting standards

    Note: The above specifications may vary.

    Our accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to correct the measurement system (network analyzer + cabling + probe) whenever it produces a reading different than the standard.

    The typical elements for calibrating a microwave measurement system consists of opens, shorts, matched loads, and throughs. These four elements have electrical characteristics that are very different from one another so that each element contributes an important part to the overall calibration process. In principle any set of standards could be employed, however, the more identical the standards are, the less accurate the calibration process becomes, which in turn results in inaccurate the on-wafer testing. Our precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results.
     

    How to select the correct calibration substrate for your probing application(s):

    1. Identify your Picoprobe's footprint and pitch (tip spacing);

    2. Determine which calibration type is appropriate for your application (SOLT, LRL/TRL, or LRM/TRM)*;

    3. Using the Calibration Substrate Selection Guide, choose the calibration substrate which matches your Picoprobe's footprint, recommended pitch range, and your preferred calibration type.

     Calibration Substrate Selection Guide

    Calibration
    Substrate

    Pad Size (microns)

    Calibration
    Types
    Supported

    Footprint

    Pitch Range
    Recommended
    (microns)

    Pitch Range
    Acceptable
    (microns)

    CS-5

    50 X 50

    SOLT, LRL,LRM

    GSG

    75 - 250

    75 -250

    CS-9

    100 X 100

    SOLT, LRL,LRM

    GSG

    250 - 600

    150 - 600

    CS-10

    150 X 150

    SOLT, LRM

    GSG

    600 - 1250

    225 - 1250

    CS-18 

    300 X 300

    SOLT, LRM

    GSG

    1250 - 2540

    500 - 2540

    CS-8

    50 X 50
    100 X 100
    150 X 150

    SOLT, LRM

    GS, SG

    50 - 200

    50 -300

    CS-14

    100 X 100

    SOLT, LRM

    GS, SG

    200 - 400

    150 - 600

    CS-11

    150 X 150

    SOLT, LRM

    GS, SG

    400 - 1250

    175 - 1250

    CS-17

    300 X 300

    SOLT, LRM

    GS, SG

    750 - 2540

    450 - 2540

    Special Calibration Substrates Designed For Use Above 110GHz

    Calibration
    Substrate

    Pad Size (microns)

    Calibration
    Types
    Supported

    Footprint

    Pitch Range
    Recommended
    (microns)

    Pitch Range
    Acceptable
    (microns)

    CS-15

    25 X 25

    SOLT, LRL,
    LRM

    GSG

    40 - 150 (SOLT)
    30 - 150 (LRL)

    40 - 150

    * SOLT = Short-Open-Load-Through
    LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line)
    LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match)

    Calibration Substrate Spec.:

    ·  Supports Precise SOLT, LRL/TRL, and LRM/TRM calibrations

    ·  Includes CalKit software for easy loading to Network Analyzer

    ·  Wide pitch range from 30 to 2,540 microns

    ·  Suitable for all Picoprobes® from DC to 220 GHz

    ·  Available for GS, SG, GSG Footprints

    ·  Convenient alignment structures

    ·  Individually tested and trimmed to exacting standards

     Differential Calibration Substrate Spec.:

    ·  Supports Precise SOLT, LRL and LRM calibrations

    ·  Includes CalKit software for easy loading to Network Analyzer

    ·  Pitch range from 90 to 1325 microns

    ·  Suitable for all Picoprobes® from DC to 110 GHz

    ·  Available for GSGSG , GSSG, and SGS Footprints

    ·  Load standards individually trimmed to 0.25% accuracy

    ·  25 mil (635 micron) thick alumina substrate

     


     

    QQ客服:销售部:  服务部: 
     

    COPYRIGHT ©  PRECISION SYSTEMS INDUSTRIAL LIMITED .ALL RIGHT RESERVED. 苏ICP备2024069327号

    销售邮箱:sales@psaic.net  服务邮箱:service@psaic.net  销售服务热线:400-848-3369